
Product Overview: AEC-Q102 is a standard for evaluating automotive optoelectronic devices, enabling high-reliability assessments of all optoelectronic components used in both the interior and exterior of vehicles. Typical products include light-emitting diodes, photodiodes, and laser assemblies. Product Description: AEC-Q102 Certification Scope: Automotive
Product Overview:
AEC-Q102 is a standard for evaluating automotive optoelectronic devices, enabling high-reliability assessments of all optoelectronic components used both inside and outside the vehicle. Typical products include light-emitting diodes, photodiodes, and laser assemblies.
Product Introduction:
Scope of AEC-Q102 Certification: All discrete optoelectronic semiconductor components and optoelectronic modules used in automotive electronics, both interior and exterior.
The AEC (Automotive Electronics Council) officially published the AEC-Q102 REV standard in March 2017. This specification primarily establishes evaluation criteria for discrete optoelectronic components entering the automotive market and currently serves as the universal international standard for automotive LEDs. The validation process includes redefining the number of test samples, methods for controlling LED Tj (Junction Temperature), and increased exposure to gas corrosion. Each requirement is designed to address the environmental conditions that automotive LEDs may encounter, thereby ensuring safety while driving.
LED light sources are being used more and more widely in automobiles; applications such as automotive lighting, lidar, smart systems, and blind-spot detection all require high-quality LEDs. As a result, many LED component suppliers are actively expanding into the automotive LED sector. However, to secure a foothold for their LED products in the automotive electronics market, passing AEC-Q102 validation is one of the most critical requirements.
Applicable Products: LEDs, laser assemblies, laser components, photodiodes, phototransistors, light-emitting diodes, light guides, photovoltaic cells, phototransistors, thermistors, thermoelectric generators, and thermoelectric coolers. Photoresistors, infrared light sources, optocouplers, light-emitting numeric tubes, and multi-chip modules utilizing optoelectronic functions and other components (e.g., LEDs with integrated circuits, laser assemblies with photodiodes, optocouplers).
Testing Process:

Test Item Classification:
● Parameter Testing: Such as optoelectronic performance testing, appearance inspection, parameter verification, physical dimensions, thermal resistance, etc.
● Environmental Stress Testing: Conduct stress tests on devices in accordance with environmental adaptability standards for military electronic components and general environmental adaptability standards for automotive electronics, including high-temperature operation, high-temperature reverse bias, high-temperature and high-humidity operation, high-temperature and high-humidity reverse bias, temperature cycling, power-temperature cycling, intermittent operating life, low-temperature operating life, pulse operation, vibration, shock, airtightness, condensation, hydrogen sulfide, mixed gases, etc.
●Process Quality Evaluation: Process quality evaluations of components are conducted for packaging, subsequent electronic assembly processes, and operational reliability, including ESD, DPA, terminal strength, solder heat resistance, solderability, wire bonding tensile and shear strength, chip thrust, and whisker growth, etc.
Test Items :
|
No. |
Test Item |
Abbreviation |
|
1 |
Functional Parameters |
TEST |
|
2 |
Pre-treatment |
PC |
|
3 |
Visual Inspection |
EV |
|
4 |
Parameter Verification |
PV |
|
5a |
High-Temperature Operational Life 1 |
HTOL 1 |
|
5b |
High-Temperature Operational Life 2 |
HTOL 2 |
|
5c |
High-Temperature Reverse Bias |
HTRB |
|
6a |
High-Temperature Operating Life 1 |
WHTOL1 |
|
6b |
High-Temperature Operating Life 2 |
WHTOL1 |
|
6c |
High-Temperature, High-Humidity Bias Test |
H3TRB |
|
7 |
Temperature Cycling |
TC |
|
8a |
Power Temperature Cycling |
PTC |
|
8b |
Intermittent Operating Life |
IOL |
|
9 |
Low-Temperature Operating Life |
LTOL |
|
10a |
Electrostatic Discharge Characteristics HBM |
HBM |
|
10b |
Electrostatic Discharge Characteristics CDM |
CDM |
|
11 |
Destructive Physical Analysis |
DPA |
|
12 |
Physical Dimensions |
PD |
|
13 |
Terminal Strength |
TS |
|
14 |
Constant Acceleration |
CA |
|
15 |
Variable-Frequency Vibration |
VVF |
|
16 |
Mechanical Shock |
MS |
|
17 |
Air Tightness |
HES |
|
18a |
Reflow Resistance |
RSH (Reflow) |
|
18b |
Resistance to Soldering Heat (Wave) |
SD (Wave) |
|
19 |
Solderability |
SD |
|
20 |
Pulse Service Life |
PLT |
|
21 |
Condensation |
DEW |
|
22 |
Hydrogen Sulfide Test |
H2S |
|
23 |
Mixed Gas Flow Test |
FMG |
|
24 |
Thermal Resistance |
TR |
|
25 |
Wire Bond Strength |
WBP |
|
26 |
Wire Bond Shear |
WBS |
|
27 |
Chip Shear |
DS |
|
28 |
Whiskers Growth |
WG |
Why ChooseArnool?
To date, Arnool has helped numerous internationally renowned companies obtain AECQ series certification.
Arnool has been recognized by multiple certification bodies and original equipment manufacturers (OEMs) for its professional technical services.
Certification bodies such as Germany’s TUV Group can provide end-to-end technical services to chip manufacturers, and their relevant capabilities and data have been recognized by TUV Dekra and others.
Standard Process for Reliability Testing of New Components

Evaluation Process for Existing Qualified Components

