AEC-Q101—Discrete Devices

Product Description:

AEC Q101 is a failure-mechanism-based stress testing and qualification standard for discrete semiconductor devices, developed by the AEC Committee. It serves as a comprehensive reliability testing and certification standard for automotive discrete semiconductor devices and represents the basic threshold for their application in the automotive sector. First published in 1996, it has been continuously updated through the E version released in 2021, which remains the most current standard in use today. The AEC Q101 standard specifies the mandatory test items that discrete semiconductor devices must undergo and pass, based on requirements for product type, package configuration, and sample size.

Applicable Products: Diodes, Zener diodes, voltage-regulating diodes, rectifier diodes, TVS diodes, MOSFETs, IGBTs, etc.

Test Item Categories:

l Parameter Testing: Including performance testing, visual inspection, parameter verification, physical dimensions, thermal resistance, avalanche withstand, short-circuit reliability, dielectric integrity, etc.

l Environmental Stress Testing: Conduct stress tests on devices in accordance with environmental qualification standards for military electronic components and general environmental qualification standards for automotive electronics, such as high-temperature reverse bias, high-temperature gate bias, temperature cycling, high-voltage steam sterilization, HAST, high-temperature and high-humidity reverse bias, high-temperature and high-humidity operation, intermittent operating life, power-temperature cycling, accelerated aging, vibration, shock, airtightness, etc.

l Process Quality Evaluation: Conduct process quality evaluations of components regarding packaging, subsequent electronic assembly processes, and operational reliability, including ESD, DPA, terminal strength, solvent resistance, soldering heat resistance, solderability, wire bonding tensile and shear strength, die push force, lead-free testing, etc.

Test Process

Test Items:

No.	Test Item	Abbreviation
1	Functional Parameters	TEST
2	Pre-treatment	PC
3	Visual Inspection	EV
4	Parameter Verification	PV
5	High-Temperature Reverse Bias	HTRB
5a	AC Blocking Voltage	A CBV
5b	High-Temperature Forward Bias	HTFB
5c	Steady-State Operation	SSOP
6	High-Temperature Gate Bias	HTGB
7	Temperature Cycling	TC
7a	Temperature Cycling Heat Test	TCHT
7alt	Temperature Cycling Stratification Test	TCDT
7b	Wire Bond Integrity	WBI
8	Unbiased Accelerated Stress Test	UHAST
8alt	High-Voltage Test	AC
9	High-Acceleration Stress Test	HAST
9alt	High-Temperature, High-Humidity Reverse Bias	H3TRB
9a	High-Temperature, High-Humidity Forward Bias	HTHHB
10	Intermittent Operating Life	IOL
10alt	Power and Temperature Cycling	PTC
11	Electrostatic Discharge Characteristics	ESD
12	Destructive Physical Analysis	DPA
13	Physical Dimensions	PD
14	Terminal Strength	TS
15	Solvent Resistance Constant Acceleration	RTS
16	Constant Acceleration	CA
17	Variable-frequency vibration	VVF
18	Mechanical shock	MS
19	Air Tightness	HES
20	Welding Heat Resistance	RSH
21	Solderability	SD
22	Thermal Resistance	TR
23	Wire-Tie Strength	WBS
24	Wire bonding shear	BS
25	Die Slicing	DS
26	Clamp-Induction Switch	UIS
27	Dielectric Properties	DI
28	Short-Circuit Reliability	S CR
29	Lead-Free	LF

 

Why ChooseArnool?

To date, Arnool has helped numerous internationally renowned companies obtain AECQ series certification.

Arnool has been recognized by numerous certification bodies and original equipment manufacturers (OEMs) for its professional technical services.

Certification bodies such as the German TUV Group provide end-to-end technical services to chip manufacturers, and their relevant capabilities and data have been recognized by organizations such as TUV Dekra.

Arnool testing and certification provides professional, comprehensive analysis services for diodes, Zener diodes, voltage-regulating diodes, rectifier diodes, TVS diodes, MOSFETs, IGBTs, and more. With service capabilities and projects covering global automakers and Tier 1 suppliers, and having established ongoing, close partnerships, Huabi is the ideal partner for AEC-Q testing and certification. Huabi can provide one-stop testing and certification services to automotive-grade discrete device manufacturers:

● Test Plan Development: Define automotive electronics test and certification plans based on product operating conditions and quality metrics;

● Test Plan Development

● Test Fixture Evaluation and Fabrication

● Test Program Development and Debugging

    ● Failure analysis and improvement recommendations

● Consolidation of AEC-Q101 test reports

● Product certification

● Technical consulting: Providing customized project development, including module components